Beamline optics

Beamline Type of Monochromator Gtating
Groove density
(L/mm)
Photon
Energy
(eV)
Typical
Resolution
(E/ E)
Photon Flux Present
Status
BL-1
(Undulator)
Grazing Incidence
26-300eV
2000
1400
2400
130-300
90-300
26-110
18000-7000
15000-4700
38000-8600
1012
(photons/sec/100mA)
in operational
BL-3
(Bending)
Double Crystal
800-2000eV
InSb(111)
Si(111)
1750-3600 >2000 5×109
(photons/sec/100mA)
(2400eV)
in operational
BL-5
(Bending)
Grazing Incidence
20-150eV
250
(450)not available
(850)not available
25-150
(130-270)
(250-540)
. . in commisioning
BL-6
(Bending)
Grazing Incidence
200-1200eV
1000(R=)
500(R=)
400-1200
200-600
. . in commisioning
BL-7
(Bending)
Grazing Incidence 1400(R=14700)
700(R=14700)
1400(R=5900)
20-105
65-190
120-380
1800
(244eV)
1011
(photons/sec/100mA)
in operational
BL-8
(Bending)
electron beam diagnostic monitor - - - - under commisioning
BL-9
(Undulator)
Noemal Incidence 600
1200
4-40 . . in operational
BL-11
(Bending)
Double Crystal
2000-5000eV
Si(111)
Si(220)
2100-5400 >2000 5×1010
(photons/sec/100mA)
3200eV)
in operational
BL-12
(Bending)
White . . . . in operational
BL-13
(Bending)
Grazing Incidence
60-1200eV
1000(R=28400)
500(R=28400)
700(R=14700)
340-1200
170-760
60-300
. 1010
(photons/secmm201%b.w./100mA)400eV
in operational
BL-14
(Bending)
Grazing Incidence
100-1200eV
1200
800
300
400-1200
270-870
100-320
4000
8000
2×1010
(photons/sec/100mA)
in operational
BL-15
(Bending)
Noemal Incidence 600
1200
4-40
blaze 120nm
blaze 70nm
. . in operational
BL-16
(Bending)
electron beam diagnostic monitor . . . . in operational